Journal: Journal of Materials Chemistry A

Article Title: 3D printed inks of two-dimensional semimetallic MoS₂/TiS₂ nanosheets for conductive-additive-free symmetric supercapacitors

doi: 10.1039/d3ta02508j

Figure Lengend Snippet: Fig. 2 Structural and spectrometric characterisation of the MoS2/TiS2 ink and 3D architectures. (a) Low-magnification SEM image of the as- printed strut (scale bar: 250 mm); (b) cross-sectional SEM image of the extruded MoS2/TiS2 filament (scale bar: 10 mm) (c) SEM image showing the morphology of an annealed MoS2/TiS2 electrode with exposed 2D flakes (scale bar: 1 mm); (d) a representative TEM image of micron-sized exfoliated MoS2 nanosheets; (scale bar: 200 nm) and the corresponding SAED pattern of a few-layered MoS2 flake illustrating the presence of the 1T′ phase (inset, scale bar: 5 nm−1) (e) a high-resolution TEM image of the MoS2 flake edge illustrating the monolayer nature of the exfoliated material; (scale bar: 2 nm) (f) a high-resolution TEM image and a Fourier filtered image (inset) highlighting the Moir´e pattern of restacked MoS2 single layers; (scale bar: 2 nm); (g, h, k and l) ToF-SIMS topographic reconstructions of MoS2/TiS2/LiMoS2/LiTiS2 species on the surface of as- printed 3D serpentine structures. (i and m) Depth profiling of MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia) species present in an as-printed and thermally annealed serpentine structure (j and n) 40 × 40 × 40 mm 3D rendered species overlay topographic reconstruction in an as-printed serpentine structure. MoS2 (blue), Li–MoS2 (turquoise), TiS2 (red) and Li–TiS2 (fuchsia).

Article Snippet: Highresolution TEM (HRTEM) imaging was performed using a JEOL JEM-2100F microscope with a eld-emission gun operated at 200 kV accelerating voltage.

Techniques:

Journal: RSC Advances

Article Title: Effect of Y doping on high-pressure behavior of Ag2S nanocrystals

doi: 10.1039/c7ra05327d

Figure Lengend Snippet: Fig. 1 (a) XRD patterns and (b and c) HRTEM images of pure and 0.41 atom% Ag2S nanocrystals at ambient conditions.

Article Snippet: The phase impurity, structure, and crystal size of the above synthesized samples were characterized by analyzing X-ray diffraction (XRD) data recorded on an X-ray power diffractometer (Shimadzu, XRD6000) with Cu Kalpha radiation (l 1⁄4 1.5406 Å), and highresolution transmission electron microscopy (HRTEM) images acquired using a JEOL JEM-2200FS at 200 kV at ambient conditions.

Techniques: